Oxford Maxxi-6 Coating Thickness Measurement

OXFORD MAXXI-6

For consistent production and high product quality Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table. With superior resolution and high efficiency SDD, the Oxford MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace level.

Key features

• Micro-focus Be window X-ray tube combines high precision, short measurement time with field-proven high reliability, outstanding product life expectancy and low cost of ownership
  
• Superior resolution Silicon Drift Detector (SDD) offers optimal efficiency at all energy levels with improved limits of detection (LOD)
  
• Multi collimator optimizes flux generation, enhancing measurement throughput
  
• Giant slotted chamber design with generous interior volume, ideal for a big variety of standard and oversized samples
  
• The “USB easy choice” allows operation using a standard computer through USB connection with no additional hardware or firmware
  
• Made in Germany to the highest engineering standards, robust design for long term reliability
  
• Approved by PTB (Physikalisch Technische Bundesanstalt), ensures highest level of radiation safety

Performance and compliance

• Made-In-Germany ensures the highest quality and reliability
  
• PTB approval ensures the highest level of radiation safety
  
• Measurement methods according to ISO 3497, ASTM B568, DIN 50987, IEC 62321

Giant slotted chamber

• Programmable XY stage
  
• Internal volume (w x d x h): 500 mm x 450 mm x 170 mm
  
• Innovative crash protection design

Programmable stage

• Easy load feature with prepositioning laser
  
• Maximized table travel range and speed
  
• Automated measurement

Software and calibration

• Intuitive Windows 7 based MaxxControl software
  
• Choice of empirical calibrations for highest accuracy or FP model for easy calibration
  
• Free selection of elements for composition analysis and free definable layer structure for thickness analysis
  
• Factory preloaded calibration for RoHS and precious metals (optional)